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As semiconductor packaging advances toward smaller nodes and higher integration, warpage has become a critical issue affecting yield and reliability. Traditional flatness control is no longer sufficient, as warpage manifests not only as global bowing but also as localized shape variations that impac

As semiconductor packaging advances toward smaller nodes and higher integration levels, packages are becoming larger and thinner, exacerbating warpage issues that were previously treated as simple flatness concerns. Today, warpage manifests as complex local shape signatures affecting bonding, alignm