www.thelec.net
2026-06-19
thelec.net
Techwing's Cube Prober, a die-level test handler. (Photo: Techwing)
South Korean semiconductor test component maker TSE is developing a next-generation test handler designed to significantly increase inspection throughput for high-bandwidth memory (HBM) devices, a move that could improve manufacturing efficiency for advanced memory production.
The company said on June 19 that it is jointly devel